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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Influence of working conditions on the detected signal by BSE detector in the scanning electron microscope Vega 3 XMU
 Tkáčová, Tereza ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
This work is focused on investigating of influence of different working conditions in scanning electron microscope to signal detected by backscattered electron detector. In the theoretical part, there is a general description of scanning electron microscope, backscattered electrons issue and also definition of methods of signal to noise ratio evaluation. The practical part is focused on observation of suitable samples in a scanning electrone microscope.
Detailed record
Influence of working conditions on the detected signal by BSE detector in the scanning electron microscope Vega 3 XMU
 Tkáčová, Tereza ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
This work is focused on investigating of influence of different working conditions in scanning electron microscope to signal detected by backscattered electron detector. In the theoretical part, there is a general description of scanning electron microscope, backscattered electrons issue and also definition of methods of signal to noise ratio evaluation. The practical part is focused on observation of suitable samples in a scanning electrone microscope.
Detailed record

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